Figure 1
From: Comparison of ring artifact removal methods using flat panel detector based CT images
The correction process shown for the modified wavelet method. (a) Sinogram image of an electrolytic capacitor, (b-e) subset sinograms, P k (n, j) for k = 1 to 4, respectively, (f-g) image view of D k (n, j) and T k (n, j) for k = 4, respectively, (h) variation of y k (j) with j. A threshold T HN should be properly selected so that only the bad pixels are detected and the edges remain outside of detection.